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Study of Helium-Ion-Beam-Generated Defects in a Monolayer WS2 Using Aberration-Corrected Scanning Transmission Electron Microscopy

  • Taeho Roy Kim (a1), Cory Cress (a2), Jose Fonseca Vega (a1), Todd Brintlinger (a3), Jeremy Robinson (a2) and Rhonda Stroud (a3)...
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      Study of Helium-Ion-Beam-Generated Defects in a Monolayer WS2 Using Aberration-Corrected Scanning Transmission Electron Microscopy
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[1] Manzeli, S., et al, Nat. Rev. Mater. 2 2017) p. 17033.
[2] Lin, Z., et al, 2D Mater 3 2016) p. 22002.
[3] Komsa, H.-P., et al, Phys. Rev. Lett. 109 2012) p. 35503.
[4] Salvatore, G.A., et al, ACS Nano. 7 2013) p. 8809.
[5] Ahn, Y., et al, Mater. Express. 6 2016) p. 69.
[6] The authors acknowledge funding from the Office of Naval Research (Naval Research Laboratory Basic Research Program). T. R. Kim and J. Fonseca Vega acknowledge National Research Council for the Research Associate Award.

Study of Helium-Ion-Beam-Generated Defects in a Monolayer WS2 Using Aberration-Corrected Scanning Transmission Electron Microscopy

  • Taeho Roy Kim (a1), Cory Cress (a2), Jose Fonseca Vega (a1), Todd Brintlinger (a3), Jeremy Robinson (a2) and Rhonda Stroud (a3)...

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