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Study by SEM of Carbon Nanotubes Deposited by CVD Using Al2O3 and TiO2 as Catalysts

Published online by Cambridge University Press:  05 August 2019

L. Béjar ,
E. Huape ,
A. Medina ,
Abraham A. Mejía ,
C. Aguilar ,
C. Parra  and
I. Alfonso
L. Béjar
Affiliation:
Facultad de Ingeniería Mecánica, Departamento de Materiales/UMSNH. Ciudad Universitaria. Morelia, Michoacán México C.P. 58000.
E. Huape
Affiliation:
Facultad de Ingeniería Mecánica, Departamento de Materiales/UMSNH. Ciudad Universitaria. Morelia, Michoacán México C.P. 58000.
A. Medina
Affiliation:
Facultad de Ingeniería Mecánica, Departamento de Materiales/UMSNH. Ciudad Universitaria. Morelia, Michoacán México C.P. 58000.
Abraham A. Mejía*
Affiliation:
Alumno Doctorado Posgrado de la Facultad de Ingeniería Mecánica/Universidad Michoacana de San Nicolás de Hidalgo, Ciudad Universitaria, C.P. 58000, Michoacán, México.
C. Aguilar
Affiliation:
Departamento de Ingeniería Metalúrgica y Materiales/Universidad Técnica Federico Santa María, Av. España 1680, Valparaíso, Chile.
C. Parra
Affiliation:
Departamento de Física/Universidad Técnica Federico Santa María, Av. España 1680, Valparaíso, Chile.
I. Alfonso
Affiliation:
Instituto de Investigaciones en Materiales, Departamento de Materiales/UNAM Campus Morelia, Antigua carretera a Pátzcuaro 8701, Morelia, Mich., México. 58190.
*
*Corresponding author: ingelectricaaamh@hotmail.com

Abstract

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Type
Applications of Integrated Electron Probe Microscopy and Microanalysis Techniques in Characterizing Natural and Synthetic Materials
Information
Microscopy and Microanalysis , Volume 25 , Supplement S2 , August 2019 , pp. 2384 - 2385
Copyright
Copyright © Microscopy Society of America 2019 

References

[1]Sierra, Germán A. and Torres, Diana M., Ing. y Compet., vol. 14, no.2 (2012) p. 136-142.Google Scholar
[2]Mejía, A. A., Béjar, L., Parra, C., Aguilar, C., Medina, A., Huape Padilla, E., Borjas-García, S. E and Bernal, J. L. Microscopy & Microanalysis., vol. 24 no.S1 (2018), p. 1094-1095.Google Scholar
[3]Béjar, L., Mejía, Abraham A., Parra, C., Aguilar, C., Medina, A., Borjas-García, S E. and Bernal, J. L., Microscopy & Microanalysis., vol. 24 no. S1 (2018), p. 1092-1093.Google Scholar