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Structured Illumination Electron Ptychography at the Atomic Scale

Published online by Cambridge University Press:  22 July 2022

Philipp Pelz ,
Hannah DeVyldere ,
Peter Ercius  and
Mary Scott
Philipp Pelz
Affiliation:
U.C. Berkeley, Berkeley, CA, United States
Hannah DeVyldere*
Affiliation:
U.C. Berkeley, Berkeley, CA, United States
Peter Ercius
Affiliation:
Lawrence Berkeley National Laboratory, Berkeley, CA, United States
Mary Scott
Affiliation:
U.C. Berkeley, Berkeley, CA, United States Lawrence Berkeley National Laboratory, Berkeley, CA, United States
*
*Corresponding author: hdevyldere@berkeley.edu

Abstract

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Type
Developments of 4D-STEM Imaging - Enabling New Materials Applications
Information
Microscopy and Microanalysis , Volume 28 , Supplement S1 , August 2022 , pp. 388 - 390
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Copyright
Copyright © Microscopy Society of America 2022

References

Allars, F, Ultramicroscopy 113257 (2021), doi:10/gjkh9j.Google Scholar
Maiden, AM et al. , J. Opt. Soc. Am. A. Opt. Image Sci. Vis. 28 (2011), p. 604.CrossRefGoogle Scholar
Odstrčil, M et al. , Opt. Express, OE 27 (2019), p. 14981.CrossRefGoogle Scholar
Li, P, Edo, T and Rodenburg, JM, Ultramicroscopy 147 (2014), p. 106.CrossRefGoogle Scholar
Pelz, PM et al. , Scientific Reports 7 (2017), p. 9883.CrossRefGoogle Scholar
Zeltmann, SE et al. , Ultramicroscopy 209 (2020), p. 112890.CrossRefGoogle Scholar
Ercius, P et al. , Microscopy and Microanalysis 26(S2) (2020), p. 1896. doi:10.1017/S1431927620019753CrossRefGoogle Scholar