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Structural Evolution of Reaction Bonded Interfacial Zone of Diamond/SiC

Published online by Cambridge University Press:  05 August 2019

Yuying Zhang
Affiliation:
Department of Materials Science and Engineering, University of Delaware, Newark, USA.
Justin Wynn
Affiliation:
TA Instruments, New Castle, USA.
Prashant Karandikar
Affiliation:
Department of Materials Science and Engineering, University of Delaware, Newark, USA. M cubed Technologies, Inc., Newark, USA.
Chaoying Ni*
Affiliation:
Department of Materials Science and Engineering, University of Delaware, Newark, USA.
*
*Corresponding author: cni@udel.edu

Abstract

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Type
Microscopy and Spectroscopy of Nanoscale Materials for Energy Applications
Copyright
Copyright © Microscopy Society of America 2019 

References

[1]Burgemeister, E.A. et al. , Phys. B+C. 93 (1978), p. 165179.Google Scholar
[2]Slack, G.A., J. Appl. Phys. 35 (1964), p. 34603466.Google Scholar
[3]Klein, C.A., Opt. Eng. 36 (1997), p. 15861596.Google Scholar
[4]This work is supported by the II-VI Foundation. Assistances from Drs. Yong Zhao and Jennifer Sloppy and the instrument use at the W. M. Keck Center for Advanced Microscopy and Microanalysis, University of Delaware, are greatly appreciated.Google Scholar