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Structural and Magnetic Characterization of B20 Skyrmion Thin Films and Heterostructures Using Aberration-Corrected Lorentz TEM and Differential Phase Contrast STEM
Published online by Cambridge University Press: 04 August 2017
Abstract
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- Microscopy and Microanalysis , Volume 23 , Supplement S1: Proceedings of Microscopy & Microanalysis 2017 , July 2017 , pp. 1732 - 1733
- Copyright
- © Microscopy Society of America 2017
References
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[6] Funding for this research was provided by the Center for Emergent Materials at the Ohio State University, an NSF MRSEC (Award Number DMR-1420451), as well as from the Ohio State Materials Seed Grants (MTB-G00010 and MTB-G00012).Google Scholar