Hostname: page-component-848d4c4894-sjtt6 Total loading time: 0 Render date: 2024-06-24T10:51:46.397Z Has data issue: false hasContentIssue false

Structural and Chemical Characterization of Ge/GeSn Core/Shell Nanowires

Published online by Cambridge University Press:  22 July 2022

Milenka Andelic*
Affiliation:
Department of Materials Science and Engineering, McMaster University, Hamilton, ON, Canada
A. Pofelski
Affiliation:
Department of Materials Science and Engineering, McMaster University, Hamilton, ON, Canada
S. Assali
Affiliation:
Department of Engineering Physics, Ecole Polytechnique Montreal, Montreal, QC, Canada
S. Koelling
Affiliation:
Department of Engineering Physics, Ecole Polytechnique Montreal, Montreal, QC, Canada
L. Luo
Affiliation:
Department of Engineering Physics, Ecole Polytechnique Montreal, Montreal, QC, Canada
O. Moutanabbir
Affiliation:
Department of Engineering Physics, Ecole Polytechnique Montreal, Montreal, QC, Canada
G.A. Botton*
Affiliation:
Department of Materials Science and Engineering, McMaster University, Hamilton, ON, Canada
*
*Corresponding authors: andelicm@mcmaster.ca, gbotton@mcmaster.ca
*Corresponding authors: andelicm@mcmaster.ca, gbotton@mcmaster.ca

Abstract

Image of the first page of this content. For PDF version, please use the ‘Save PDF’ preceeding this image.'
Type
Advanced Imaging and Spectroscopy for Nanoscale Materials
Copyright
Copyright © Microscopy Society of America 2022

References

Wirths, S et al. , Nature photonics 9(2) (2015), p. 88-92.10.1038/nphoton.2014.321CrossRefGoogle Scholar
Moutanabbir, O et al. , Applied Physics Letters 118(11) (2021), p. 110502.10.1063/5.0043511CrossRefGoogle Scholar
Assali, S et al. Nano letters 17(3) (2017), p. 1538.10.1021/acs.nanolett.6b04627CrossRefGoogle Scholar
Pofelski, A, Strain Characterization Using Scanning Transmission Electron Microscopy and Moiré Interferometry (Doctoral dissertation, McMaster University) (2020).Google Scholar
Zamani, RR et al. , arXiv preprint (2021) arXiv:2103.04632.Google Scholar
This work was carried out at the Canadian Centre for Electron Microscopy, a national facility supported by the Canada Foundation for Innovation under the MSI program, McMaster University, Defence Canada (Innovation for Defence Excellence and Security, IDEaS), and NSERC.Google Scholar