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Strategies for Standardizing EDS Measurements

Published online by Cambridge University Press:  22 July 2022

Nicholas W. M. Ritchie
Nicholas W. M. Ritchie*
Affiliation:
National Institute of Standards and Technology, Materials Measurement Science Division, Gaithersburg, MD, USA
*
*Corresponding author: nicholas.ritchie@nist.gov

Abstract

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Type
Quantitative and Qualitative Mapping of Materials
Information
Microscopy and Microanalysis , Volume 28 , Supplement S1 , August 2022 , pp. 496 - 498
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Copyright
Copyright © Microscopy Society of America 2022

References

Taylor, J.R., Error Analysis, Univ. Science Books, (Sausalito, CA).Google Scholar
Ritchie, N.W.M., Mengason, M.J. and Newbury, D.E., Microscopy and Microanalysis 23 (2017), p. 220.10.1017/S1431927617001787CrossRefGoogle Scholar
Ritchie, N. W. M., Reproducible Spectrum and Hyperspectrum Data Analysis using NeXL, accepted for publication, Microscopy and Microanalysis (2022).10.1017/S143192762200023XCrossRefGoogle Scholar
Duane, W. & Hunt, F.L., Physical Review 6 (1915).Google Scholar