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STEM-EELS Analysis of Niobium Oxide Multilayer Films for High Temperature Memristor Devices

Published online by Cambridge University Press:  22 July 2022

Bradley T De Gregorio ,
Evgeniya Lock ,
Keith Knipling  and
Hans Cho
Bradley T De Gregorio*
Affiliation:
U.S. Naval Research Laboratory, Washington, DC, USA
Evgeniya Lock
Affiliation:
U.S. Naval Research Laboratory, Washington, DC, USA
Keith Knipling
Affiliation:
U.S. Naval Research Laboratory, Washington, DC, USA
Hans Cho
Affiliation:
U.S. Naval Research Laboratory, Washington, DC, USA
*
*Corresponding author: bradley.degregorio@nrl.navy.mil

Abstract

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Type
Correlative Microscopy and High-Throughput Characterization for Accelerated Development of Materials in Extreme Environments
Information
Microscopy and Microanalysis , Volume 28 , Supplement S1 , August 2022 , pp. 2054 - 2056
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Copyright
Copyright © Microscopy Society of America 2022

References

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