Hostname: page-component-76fb5796d-5g6vh Total loading time: 0 Render date: 2024-04-26T01:23:03.900Z Has data issue: false hasContentIssue false
  • English
  • Français

A Standards-Based Method to Determine Elemental Compositions using Energy Dispersive X-Ray Spectrometry for Compound Semiconductors

Published online by Cambridge University Press:  23 November 2012

M. Rathi ,
P. Ahrenkiel ,
J. Carapella  and
M. Wanlass
M. Rathi
Affiliation:
South Dakota School of Mines and Technology, Rapid City, SD
P. Ahrenkiel
Affiliation:
South Dakota School of Mines and Technology, Rapid City, SD
J. Carapella
Affiliation:
National Renewable Energy Lab, Golden, CO
M. Wanlass
Affiliation:
National Renewable Energy Lab, Golden, CO
Get access

Abstract

Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.

Type
Research Article
Information
Microscopy and Microanalysis , Volume 18 , Issue S2: Proceedings of Microscopy & Microanalysis 2012 , July 2012 , pp. 1046 - 1047
Copyright
Copyright © Microscopy Society of America 2012

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)