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Stable and Flexible Side-Entry Stage for Nion STEMs

Published online by Cambridge University Press:  04 August 2017

Michael T. Hotz ,
George Corbin ,
Niklas Delby ,
Tracy C. Lovejoy ,
Gwyn Skone ,
Jean-Denis Blazit ,
Mathieu Kociak ,
Odile Stephan ,
Marcel Tencé  and
Henny W. Zandbergen
...Show all authors
Michael T. Hotz
Affiliation:
Nion R&D, 11511 NE 118th St., Kirkland, WA 98034, USA
George Corbin
Affiliation:
Nion R&D, 11511 NE 118th St., Kirkland, WA 98034, USA
Niklas Delby
Affiliation:
Nion R&D, 11511 NE 118th St., Kirkland, WA 98034, USA
Tracy C. Lovejoy
Affiliation:
Nion R&D, 11511 NE 118th St., Kirkland, WA 98034, USA
Gwyn Skone
Affiliation:
Nion R&D, 11511 NE 118th St., Kirkland, WA 98034, USA
Jean-Denis Blazit
Affiliation:
Laboratoire de Physique des Solides, CNRS, Université Paris Sud XI, F 91405 Orsay, France
Mathieu Kociak
Affiliation:
Laboratoire de Physique des Solides, CNRS, Université Paris Sud XI, F 91405 Orsay, France
Odile Stephan
Affiliation:
Laboratoire de Physique des Solides, CNRS, Université Paris Sud XI, F 91405 Orsay, France
Marcel Tencé
Affiliation:
Laboratoire de Physique des Solides, CNRS, Université Paris Sud XI, F 91405 Orsay, France
Henny W. Zandbergen
Affiliation:
Department of NanoScience, Delft University of Technology, 2628 CJ Delft, The Netherlands
Ondrej L. Krivanek
Affiliation:
Nion R&D, 11511 NE 118th St., Kirkland, WA 98034, USA Department of Physics, Arizona State University, Tempe, AZ 85287, USA

Abstract

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Type
Abstract
Information
Microscopy and Microanalysis , Volume 23 , Supplement S1: Proceedings of Microscopy & Microanalysis 2017 , July 2017 , pp. 54 - 55
Copyright
© Microscopy Society of America 2017 

References

[1] Krivanek, OL, et al, Ultramicroscopy 108 2008 179.CrossRefGoogle Scholar
[2] Krivanek, OL, et al, Microsc. Microanal 16(Suppl 2 2010 70.CrossRefGoogle Scholar
[3] Kociak, M & Zagonel, LF Ultramicroscopy 174 2017 50.Google Scholar
[4] Krivanek, OL, et al, Nature 514 2014 209.CrossRefGoogle Scholar