No CrossRef data available.
Article contents
Spatially Resolved Soft X-ray Spectroscopy in Scanning X-ray Microscopes
Published online by Cambridge University Press: 05 August 2019
Abstract
An abstract is not available for this content so a preview has been provided. As you have access to this content, a full PDF is available via the ‘Save PDF’ action button.
![Image of the first page of this content. For PDF version, please use the ‘Save PDF’ preceeding this image.'](https://static.cambridge.org/content/id/urn%3Acambridge.org%3Aid%3Aarticle%3AS1431927619002009/resource/name/firstPage-S1431927619002009a.jpg)
- Type
- Low-Energy X-Ray Analysis: Novel Applications Using Soft X-Ray Emission Spectroscopy (SXES), Cathodoluminescence (CL), and Synchrotron Techniques
- Information
- Copyright
- Copyright © Microscopy Society of America 2019
References
[1]Hitchcock, AP in “Handbook on Nanoscopy” eds. Van Tendeloo, G., Van Dyck, D. and Pennycook, S. J. (Wiley).Google Scholar
[5]Krüger, P et al. , Rad. Phys. & Chem (2019) in press. doi: 10.1016/j.radphyschem.2019.01.014Google Scholar
[8]Research performed using the ambient-STXM on beamline 10ID1 at the Canadian Light Source, which is supported by the Canada Foundation for Innovation.Google Scholar