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SIMS Imaging Performed on Focused Ion Beam - based Platforms

Published online by Cambridge University Press:  22 July 2022

Jean-Nicolas Audinot ,
Alexander D. Ost ,
Charlotte Stoffels ,
Patrick Philipp ,
Olivier De Castro ,
Antje Biesemeier ,
Quang Hung Hoang  and
Tom Wirtz
Jean-Nicolas Audinot*
Affiliation:
Advanced Instrumentation for Nano-Analytics (AINA), MRT Department, Luxembourg Institute of Science and Technology (LIST), Belvaux, Luxembourg
Alexander D. Ost
Affiliation:
Advanced Instrumentation for Nano-Analytics (AINA), MRT Department, Luxembourg Institute of Science and Technology (LIST), Belvaux, Luxembourg University of Luxembourg, Esch-sur-Alzette, Luxembourg
Charlotte Stoffels
Affiliation:
Advanced Instrumentation for Nano-Analytics (AINA), MRT Department, Luxembourg Institute of Science and Technology (LIST), Belvaux, Luxembourg University of Luxembourg, Esch-sur-Alzette, Luxembourg
Patrick Philipp
Affiliation:
Advanced Instrumentation for Nano-Analytics (AINA), MRT Department, Luxembourg Institute of Science and Technology (LIST), Belvaux, Luxembourg
Olivier De Castro
Affiliation:
Advanced Instrumentation for Nano-Analytics (AINA), MRT Department, Luxembourg Institute of Science and Technology (LIST), Belvaux, Luxembourg
Antje Biesemeier
Affiliation:
Advanced Instrumentation for Nano-Analytics (AINA), MRT Department, Luxembourg Institute of Science and Technology (LIST), Belvaux, Luxembourg
Quang Hung Hoang
Affiliation:
Advanced Instrumentation for Nano-Analytics (AINA), MRT Department, Luxembourg Institute of Science and Technology (LIST), Belvaux, Luxembourg
Tom Wirtz
Affiliation:
Advanced Instrumentation for Nano-Analytics (AINA), MRT Department, Luxembourg Institute of Science and Technology (LIST), Belvaux, Luxembourg
*
*Corresponding author : jean-nicolas.audinot@list.lu

Abstract

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Type
Surface and Subsurface Microscopy and Microanalysis of Physical and Biological Specimens
Information
Microscopy and Microanalysis , Volume 28 , Supplement S1 , August 2022 , pp. 944 - 946
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Copyright
Copyright © Microscopy Society of America 2022

References

Sangely, L. et al. in “Sector Field Mass Spectrometry for Elemental and Isotopic Analysis “. Ed. Prohaska, T., Irrgeher, J., Zitek, A., Jakubowski, N. (Royal Society of Chemistry, Cambridge) p. 439.Google Scholar
Nuñez, J. et al. , Biointerphases 13, (2018) p. 03B301. doi: 10.1116/1.4993628CrossRefGoogle Scholar
Sezen, M. in “Modern Electron Microscopy in Physical and Life Sciences”, Ed. Janecek, Milos and Kral, Robert (IntechOpen Book Series) p. 121.Google Scholar
Introduction to Focus. Ion Beams Instrumentation. Ed. Giannuzzi, L. F., Stevie, F. A., (Springer, Boston, MA) p 1. doi: 10.1007/B101190.Google Scholar
Wirtz, T., De Castro, O., Audinot, J. N., and Philipp, P., Annu. Rev. Anal. Chem. 12 (2019), p. 523. doi:10.1146/annurev-anchem-061318-115457.CrossRefGoogle Scholar
Knuffman, B., Steele, A. V., and McClelland, J. J., J. Appl. Phys. 114, (2013), p. 044303. doi: 10.1063/ 1.4816248.CrossRefGoogle Scholar
Dowsett, D. and Wirtz, T., Anal. Chem. 89 (17), (2017), p. 8957, doi: 10.1021/acs.analchem. 7b01481.CrossRefGoogle Scholar
Ost, A. D. et al. , Environ. Sci. Technol. 55, (2021), p. 9384. doi: 10.1021/acs.est.1c02971.CrossRefGoogle Scholar
Vollnhals, F. and Wirtz, T, Anal. Chem. 2018, 90 , (20), p. 11989. doi: 10.1021/ acs.analchem.8b02530.CrossRefGoogle Scholar
Vollnhals, F. et al. , Anal. Chem. 89, (2017), p. 10702. doi: 10.1021/acs.analchem.8b02530.CrossRefGoogle Scholar
Usiobo, J. et al. J. Phys. Chem. C, 124 , (42) (2020), p. 23230. doi : 10.1021/acs.jpcc.0c07464.CrossRefGoogle Scholar
Liu, Y. et al. Nat. Mater. 17 (11), (2018), p. 1013. doi: 10.1038/s41563-018-0152-z.CrossRefGoogle Scholar
Gillois, et al. Sci. Total Environ. 2020, 754, 142324. doi: 10.1016/j.scitotenv.2020.142324.CrossRefGoogle Scholar
The authors gratefully acknowledge support by the Luxembourg National Research Fund (FNR) under grant no. INTER/DFG/17/11779689, and grant no. INTER/ANR/18/12545362.Google Scholar