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A Simplified Approach to Determining Resolution of Optical, Ion and Electron Microscope Images

Published online by Cambridge University Press:  27 August 2014

A. E. Curtin ,
R. Skinner  and
A.W. Sanders

Abstract

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Abstract
Information
Microscopy and Microanalysis , Volume 20 , Supplement S3: Proceedings of Microscopy & Microanalysis 2014 , August 2014 , pp. 984 - 985
Copyright
Copyright © Microscopy Society of America 2014 

References

[1] Joy, D. C., Michael, J., and Griffin, B. Proc. of SPIE (2010) p 76383J.Google Scholar
[2] Kohno, Y., et al., Microsc. Microanal. 17 (2011) p 1162.Google Scholar
[3] Image courtesy of Toshihiro Aoki, Arizona State University, unpublished.Google Scholar
[4] Rieger, B., van Veen, G. N. A. EMC 2008 14th European Microscopy Congress 1-5 September (2008, Aachen, Germany, ed. M. Luysberg, K. Tillmann, and T. Weirich (Springer Berlin Heidelberg, Berlin) p 613.Google Scholar
[5] This work is a contribution of NIST, an agency of the U.S. government and as such is not subject to copyright in the United States.Google Scholar