Hostname: page-component-5c6d5d7d68-7tdvq Total loading time: 0 Render date: 2024-08-18T08:04:37.460Z Has data issue: false hasContentIssue false
  • English
  • Français

Sensitivity of an Atomic Force Microscope Cantilever with a Crack

Published online by Cambridge University Press:  27 August 2014

Haw-Long Lee ,
Yu-Ching Yang  and
Win-Jin Chang

Abstract

An abstract is not available for this content so a preview has been provided. As you have access to this content, a full PDF is available via the ‘Save PDF’ action button.
Image of the first page of this content. For PDF version, please use the ‘Save PDF’ preceeding this image.'
Type
Abstract
Information
Microscopy and Microanalysis , Volume 20 , Supplement S3: Proceedings of Microscopy & Microanalysis 2014 , August 2014 , pp. 1940 - 1941
Copyright
Copyright © Microscopy Society of America 2014 

References

[1] Binnig, G., Quate, C. F., and Gerber, C. Phy. Rev. Lett. 56 (1986) p.930.Google Scholar
[2] Kahrobaiyan, M.H., et al, Int. J. Eng. Sci. 48 (2010)p.1985.Google Scholar
[3] Lee, H.L.and Chang, W.J. Jap. J. Appl. Phys. 51 (2012)p.035202.Google Scholar
[4] Payam, a.F.and Fathipour, M. Arab, J. Sci, Eng, 39 (2014)p.1393.Google Scholar
[5] Shafai, C., Brett, M.J., and Hrudey, T.M. Sensors Actu. A 70 (1998)p.283.Google Scholar
[6] Yang, F., et al, Int. J. Solids Struct. 39 (2002)p.2731.Google Scholar