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Sensitivity of 4D-STEM to Valence Electron Distribution Based on Multipole Density Formalism

Published online by Cambridge University Press:  30 July 2020

Lijun Wu
Affiliation:
Brookhaven National Laboratory, Upton, New York, United States
Qingping Meng
Affiliation:
Brookhaven National Laboratory, Upton, New York, United States
Yimei Zhu
Affiliation:
Brookhaven National Laboratory, Upton, New York, United States
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Abstract

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Type
Four-Dimensional Scanning Transmission Electron Microscopy (4D-STEM): New Experiments and Data Analyses for Determining Materials Functionality and Biological Structures
Copyright
Copyright © Microscopy Society of America 2020

References

Zhu, Y., Zheng, J. C., Wu, L., Frenkel, A. I., Hanson, J., Northrup, P., Ku, W., Phys. Rev. Lett. 99 (2007), 037602.Google Scholar
Gao, W. et al. Nature 575 (2019), 480484.10.1038/s41586-019-1649-6CrossRefGoogle Scholar
Coppens, P., X-Ray Charge Densities and Chemical Bonding (Oxford University Press, New York, 1997).10.1093/oso/9780195098235.001.0001CrossRefGoogle Scholar
The authors acknowledge funding from the US DOE-BES, Materials Science and Engineering Division, under Contract No. DESC0012704.Google Scholar

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Sensitivity of 4D-STEM to Valence Electron Distribution Based on Multipole Density Formalism
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