Hostname: page-component-848d4c4894-xfwgj Total loading time: 0 Render date: 2024-07-04T06:43:19.217Z Has data issue: false hasContentIssue false
  • English
  • Français

Sensitivity And Quantitativity In Atom Probe Tomography

Published online by Cambridge University Press:  26 July 2009

F Danoix ,
A Bostel ,
A Leitner ,
P Jessner ,
X Sauvage ,
M Gouné  and
R Danoix
F Danoix
Affiliation:
Université de Rouen,France
A Bostel
Affiliation:
Université de Rouen,France
A Leitner
Affiliation:
Montanuniversität Leoben,Austria
P Jessner
Affiliation:
Université de Rouen,France
X Sauvage
Affiliation:
Université de Rouen,France
M Gouné
Affiliation:
ArcelorMittal, France
R Danoix
Affiliation:
Université de Rouen,France

Extract

Core share and HTML view are not available for this content. However, as you have access to this content, a full PDF is available via the ‘Save PDF’ action button.

Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

Type
Abstract
Information
Microscopy and Microanalysis , Volume 15 , Supplement S2 , July 2009 , pp. 258 - 259
Copyright
Copyright © Microscopy Society of America 2009