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Second Difference Electron Energy-Loss Spectroscopy with the Gatan Imaging Filter

Published online by Cambridge University Press:  02 July 2020

E.C. Buck*
Affiliation:
Argonne National Laboratory, 9700 South Cass Avenue, Argonne, IL60439
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Extract

The large number of minor elements present in geological specimens and nuclear waste materials, can make TEM/EDS analysis of such samples troublesome. With a parallel detector such as the Gatan PEELS 666, the second difference technique has been shown to be effective at removing the channel-to-channel gain variation [1]. As spectroscopy performed with the Gatan Imaging Filter (GIF200) averages over a 2D array, gain variations are minimal; however, the second-difference technique selectively enhances the high frequency features such as the “white line” absorption edges, particularly of rare earth elements (REE) and transuranics (TRU). The second difference method may thus still have merit with the GIF200. A script was created within the controlling software program (DigitalMicrograph ™) which permitted second difference acquisition [2]. The Spectroscopy Package was also modified with ResEdit and the required values were added to the Global Tags to enable easy application of the second difference routine.

Type
Future of Microscopy: Ceramics, Composites, and Cement
Copyright
Copyright © Microscopy Society of America

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References

[1]Krivanek, O.L.and Kundmann, M.K., International Symposium on Electron Microscopy, eds. Kuo, K. and Yao, J. (Beijing, China, 1991) pp. 381.Google Scholar
[2] Gatan Manual (1997)Google Scholar
[3]Fortner, J.A. and Buck, E.C., Appl. Phys. Lett. 68 (1996) 3817.CrossRefGoogle Scholar
[4]Buck, E.C. and Fortner, J.A.Ultramicroscopy 66 (1997) 69.CrossRefGoogle Scholar
[5] Thanks to Kundmann, M.K.(Gatan, Inc.) for his assistance. Work supported by the U.S. Department of Energy under contract W-31-109-ENG-38.Google Scholar