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Scanning Transmission Electron Microscopy and Diffraction in SEM: Novel Approaches for In Situ Studies

Published online by Cambridge University Press:  07 February 2019

Erdmann Spiecker
Affiliation:
Center for Nanoanalysis and Electron Microscopy (CENEM) & Institute of Micro- and Nanostructure Research, Department of Materials Science and Engineering, Friedrich-Alexander- Universität Erlangen-Nürnberg, 91058 Erlangen, Germany.
Christian Dolle
Affiliation:
Center for Nanoanalysis and Electron Microscopy (CENEM) & Institute of Micro- and Nanostructure Research, Department of Materials Science and Engineering, Friedrich-Alexander- Universität Erlangen-Nürnberg, 91058 Erlangen, Germany.
Peter Schweizer
Affiliation:
Center for Nanoanalysis and Electron Microscopy (CENEM) & Institute of Micro- and Nanostructure Research, Department of Materials Science and Engineering, Friedrich-Alexander- Universität Erlangen-Nürnberg, 91058 Erlangen, Germany.
Peter Denninger
Affiliation:
Center for Nanoanalysis and Electron Microscopy (CENEM) & Institute of Micro- and Nanostructure Research, Department of Materials Science and Engineering, Friedrich-Alexander- Universität Erlangen-Nürnberg, 91058 Erlangen, Germany.

Abstract

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Type
Innovations in Techniques to Study Nanomaterial Processes
Copyright
Copyright © Microscopy Society of America 2019 

References

References:

[1]Dolle, C, Schweizer, P and Spiecker, E, Proceedings of the Microscopy Conference MC2017, 21 - 25 August 2017, Lausanne (Switzerland), p. 498.Google Scholar
[2]Schweizer, P, Dolle, C and Spiecker, E, Science Advances, accepted.Google Scholar
[3]The authors acknowledge funding from the German Research Foundation (DFG) through the Research Training Group GRK 1896 „In situ microscopy with electrons, X-rays and scanning probes” and the Collaborative Research Center SFB 953 „Synthetic carbon allotropes”.Google Scholar