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Scanning Electron Microscopy in High School Engineering Research

Published online by Cambridge University Press:  01 August 2018

Michael A. Boyer
Michael A. Boyer*
Affiliation:
Technology and Engineering Education Department, Engineering Academy, North Penn High School, Lansdale, PA, USA

Abstract

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Type
Abstract
Information
Microscopy and Microanalysis , Volume 24 , Supplement S1: Proceedings of Microscopy & Microanalysis 2018 , August 2018 , pp. 2348 - 2349
Copyright
© Microscopy Society of America 2018 

References

[1] The Future is N.E.A.R. Nanotechnology and Engineering Research at North Penn High School 2018) Retrieved from http://www.thefutureisnear.org.Google Scholar
[2] STEM Education Activity Example, Lesson Plans, Inspire STEM Education 2014) Retrieved from http://www.inspirestemeducation.us/wp-content/uploads/2014/05/SEM-Exploration-Activity.pdf.Google Scholar
[3] Perkins, Dr. James, Winston Churchill Memorial Trust https://www.wcmt.org.uk/users/jamesperkins2016.Google Scholar
[4] Drexel University, Evan Slow at Angstrom Scientific, Robert Gordon at Hitachi High Technologies America, and The North Penn Educational Foundation are gratefully acknowledged for their support.Google Scholar