Hostname: page-component-7479d7b7d-wxhwt Total loading time: 0 Render date: 2024-07-12T17:38:44.737Z Has data issue: false hasContentIssue false
  • English
  • Français

Routine Microscopy in Quantum Dot Industry

Published online by Cambridge University Press:  05 August 2019

Xiao Feng Zhang
Xiao Feng Zhang*
Affiliation:
Nanosys Inc., 233 S. Hillview Drive, Milpitas, CA 95035
*
*Corresponding author: xzhang@nanosysinc.com

Abstract

An abstract is not available for this content so a preview has been provided. As you have access to this content, a full PDF is available via the ‘Save PDF’ action button.
Image of the first page of this content. For PDF version, please use the ‘Save PDF’ preceeding this image.'
Type
Microscopy and Microanalysis for Real-World Problem Solving
Information
Microscopy and Microanalysis , Volume 25 , Supplement S2 , August 2019 , pp. 702 - 703
Copyright
Copyright © Microscopy Society of America 2019