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A Robust 3D Scanning Technique for SEM

Published online by Cambridge University Press:  04 August 2017

Grigore Moldovan
Grigore Moldovan*
Affiliation:
point electronic GmbH, Erich-NeuB-Weg 15, D-06120 Halle, Germany

Abstract

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Abstract
Information
Microscopy and Microanalysis , Volume 23 , Supplement S1: Proceedings of Microscopy & Microanalysis 2017 , July 2017 , pp. 356 - 357
Copyright
© Microscopy Society of America 2017 

References

[1] Boyde, A & Ross, H F The Photogrammetric Record 8 1975). p. 408.Google Scholar
[2] Gontard, L C, et al, Ultramicroscopy 169 2016). p. 80.Google Scholar
[3] Boyde, A Journal of Microscopy 98 1973). p. 452.Google Scholar
[4] Hemmleb, M, et al, European Microscopy Congress 2016). p. 489.Google Scholar