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RISE imaging of various phases of SiC in sintered silicon-carbide ceramics

Published online by Cambridge University Press:  30 July 2021

Ute Schmidt
Affiliation:
WITec GmbH, Ulm, Baden-Wurttemberg, Germany
Wei Liu
Affiliation:
WITec Instruments, Knoxville, Tennessee, United States
Michael Müller
Affiliation:
Technische Hochschule Rosenheim, Rosenheim, Bayern, Germany
Jan Englert
Affiliation:
WITec GmbH, Ulm, Germany

Abstract

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Type
Advanced Imaging and Spectroscopy for Nanoscale Materials Characterization
Copyright
Copyright © The Author(s), 2021. Published by Cambridge University Press on behalf of the Microscopy Society of America

References

Salmang, H. and Keramik, H. Scholze ed. 7 Springer, Berlin-Heidelberg (2007)Google Scholar
Jiruse, J., et al. , J. Vac. Sci. & Technology B 32, (2014) 06FC03-1.Google Scholar
Wille, G. et al. , Spectroscopy 33 (2018) 44.Google Scholar
Chikvaidze, G. et al. , Latvian J. of Phys. and Technical Sci. N3 (2014) 51.CrossRefGoogle Scholar
Lin, S. et al. , Material Research 15 (2012) 833.CrossRefGoogle Scholar
Huber, A. et al. , Optics Express 25 (2009) 22351.Google Scholar