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A RF Broadband Biasing Holder for Ultrafast Stroboscopic Electron Microscopy

Published online by Cambridge University Press:  01 August 2018

Karl B. Schliep ,
Michael B. Katz  and
June W. Lau
Karl B. Schliep
Affiliation:
The National Institute of Standards and Technology, Material Measurement Laboratory, Gaithersburg, USA
Michael B. Katz
Affiliation:
The National Institute of Standards and Technology, Material Measurement Laboratory, Gaithersburg, USA
June W. Lau
Affiliation:
The National Institute of Standards and Technology, Material Measurement Laboratory, Gaithersburg, USA

Abstract

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Abstract
Information
Microscopy and Microanalysis , Volume 24 , Supplement S1: Proceedings of Microscopy & Microanalysis 2018 , August 2018 , pp. 1852 - 1853
Copyright
© Microscopy Society of America 2018 

References

[1] Adhikari, A., et al, ACS Appl. Mater. Interfaces 9 2017) p. 3.Google Scholar
[2] Shorokhov, D. Zewail, A. H. J. Chem. Phys. 144 2016) p. 080901.Google Scholar
[3] Qiu, J., et al, Ultramicroscopy 161 2016) p. 130.Google Scholar
[4] This research was performed while the author held an NRC Research Associateship award at the National Institute of Standards and Technology in Gaithersburg, MD.Google Scholar