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Resolving Ambiguities at the Bi2Te3/GaAs Interface with Atomic Resolution EDS

Published online by Cambridge University Press:  09 October 2013

J.H. Dycus
J.H. Dycus*
Affiliation:

Abstract

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Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.

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Abstract
Information
Microscopy and Microanalysis , Volume 19 , Issue S2: Proceedings of Microscopy & Microanalysis 2013 , August 2013 , pp. 1140 - 1141
Copyright
Copyright © Microscopy Society of America 2013