Hostname: page-component-76fb5796d-vvkck Total loading time: 0 Render date: 2024-04-26T19:04:55.789Z Has data issue: false hasContentIssue false
  • English
  • Français

Resolution Models for Energy-Filtered TEM Imaging over Thick Liquid or Amorphous Layers

Published online by Cambridge University Press:  30 July 2021

Eduardo Ortega  and
Niels de Jonge
Eduardo Ortega
Affiliation:
INM - Leibniz Institute for New Materials, Saarbrücken, Texas, Germany
Niels de Jonge
Affiliation:
INM – Leibniz Institute for New Materials, Saarbrücken, Germany

Abstract

An abstract is not available for this content so a preview has been provided. As you have access to this content, a full PDF is available via the ‘Save PDF’ action button.
Image of the first page of this content. For PDF version, please use the ‘Save PDF’ preceeding this image.'
Type
New Frontiers in In-Situ Electron Microscopy in Liquids and Gases (L&G EM FIG Sponsored)
Information
Microscopy and Microanalysis , Volume 27 , Supplement S1 , August 2021 , pp. 802 - 803
Copyright
Copyright © The Author(s), 2021. Published by Cambridge University Press on behalf of the Microscopy Society of America

References

Yang, J et al. , Microsc Microanal 25(S2) (2019) p. 1406.CrossRefGoogle Scholar
Ghodsi, SM et al. , Small Methods 3 (2019) 1900026.CrossRefGoogle Scholar
de Jonge, N, Ultramicroscopy 187 (2018) p. 113.CrossRefGoogle Scholar
Su, DS, Wang, HF and Zeitler, E, Ultramicroscopy 59 (1995) p. 181.Google Scholar
de Jonge, N, Verch, A and Demers, H, Microsc Microanal 24 (2018), p. 8.CrossRefGoogle Scholar
The authors thank E. Arzt for his support through INM. The research was supported by the German Research Foundation.Google Scholar