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Reproducible in-situ electrical biasing of resistive memory materials using piezo-controlled electrical contacts and chip based systems.

Published online by Cambridge University Press:  30 July 2021

David Cooper  and
Matthew Bryan
David Cooper
Affiliation:
Univ Grenoble Alpes, CEA, LETI, France
Matthew Bryan
Affiliation:
Univ Grenoble Alpes, CEA, LETI, France

Abstract

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Type
Investigating Phase Transitions in Functional Materials and Devices by In Situ/Operando TEM
Information
Microscopy and Microanalysis , Volume 27 , Supplement S1 , August 2021 , pp. 164 - 166
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Copyright
Copyright © The Author(s), 2021. Published by Cambridge University Press on behalf of the Microscopy Society of America

References

Waser, R and Aono, M., Nature Materials 6 833 (2007)Google Scholar
Cooper, D. et al. , Advanced Materials 29 1700212 (2017)Google Scholar
Muller, D. A. et al. , Nature 430 657 (2004)CrossRefGoogle Scholar
Acknowledgments: David Cooper thanks the European Research Council for funding the Starting Grant Holoview (Stg:506535). These experiments were performed on the platform Nanocharacterisation at Minatec (PFNC).Google Scholar