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Removal of FEG Fluctuations in STEM Imaging

Published online by Cambridge University Press:  27 August 2014

Shixin Wang
Shixin Wang*
Affiliation:
Micron Technology, Inc., 8000 S. Federal Way, Boise, ID 83707, USA

Abstract

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Type
Abstract
Information
Microscopy and Microanalysis , Volume 20 , Supplement S3: Proceedings of Microscopy & Microanalysis 2014 , August 2014 , pp. 134 - 135
Copyright
Copyright © Microscopy Society of America 2014 

References

[1] Mitchell, D. http://www.dmscripting.com/remove_feg_fluctuations.html.Google Scholar
[2] Pennycook, S. J.andNellist, P. D. Scanning Transmission Electron Microscopy: Imaging and Analysis” (Springer, New York, 2011), pp 14-15.Google Scholar