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Relativistic Ultrafast Electron Diffraction of Nanomaterials

Published online by Cambridge University Press:  30 July 2020

Daniel Durham ,
Khalid Siddiqui ,
Fuhao Ji ,
Jorge Giner Navarro ,
Pietro Musumeci ,
Robert Kaindl ,
Andrew Minor  and
Daniele Filippetto
Daniel Durham
Affiliation:
University of California, Berkeley, Berkeley, California, United States
Khalid Siddiqui
Affiliation:
Lawrence Berkeley National Laboratory, Berkeley, California, United States
Fuhao Ji
Affiliation:
SLAC National Accelerator Laboratory, Menlo Park, California, United States
Jorge Giner Navarro
Affiliation:
University of California, Los Angeles, Los Angeles, California, United States
Pietro Musumeci
Affiliation:
University of California, Los Angeles, Los Angeles, California, United States
Robert Kaindl
Affiliation:
Lawrence Berkeley National Laboratory, Berkeley, California, United States
Andrew Minor
Affiliation:
University of California, Berkeley, Berkeley, California, United States Lawrence Berkeley National Laboratory, Berkeley, California, United States
Daniele Filippetto
Affiliation:
Lawrence Berkeley National Laboratory, Berkeley, California, United States

Abstract

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Type
Electron Pulses as an Ultrafast Probe for Non-Equilibrium Processes
Information
Microscopy and Microanalysis , Volume 26 , Supplement S2 , August 2020 , pp. 676 - 677
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Copyright
Copyright © Microscopy Society of America 2020

References

Filippetto, D. and Qian, H., “Design of a high-flux instrument for ultrafast electron diffraction and microscopy,” J. Phys. B: At., Mol. Opt. Phys, vol. 49, 104003, 2016.10.1088/0953-4075/49/10/104003CrossRefGoogle Scholar
Ji, F., Durham, D. B., Minor, A. M., Musumeci, P., Navarro, J. G., and Filippetto, D., “Ultrafast relativistic electron nanoprobes,” Communications Physics, vol. 2, no. 1, p. 54, 2019.10.1038/s42005-019-0154-4CrossRefGoogle Scholar
Ji, F., Navarro, J. G., Musumeci, P., Durham, D. B., Minor, A. M., and Filippetto, D., “Knife-edge based measurement of the 4D transverse phase space of electron beams with picometer-scale emittance,” Phys. Rev. Accel. Beams, vol. 22, no. 8, 082801, 2019.10.1103/PhysRevAccelBeams.22.082801CrossRefGoogle Scholar