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Recovering Chemistry at Atomic Resolution using Multi-Modal Spectroscopy

Published online by Cambridge University Press:  30 July 2021

Jonathan Schwartz ,
Yi Jiang ,
Zichao Wendy Di ,
Tao Ma ,
Huihuo Zheng ,
Steve Rozeveld  and
Robert Hovden
Jonathan Schwartz
Affiliation:
Department of Materials Science and Engineering, University of Michigan, United States
Yi Jiang
Affiliation:
Advanced Photon Source, Argonne National Laboratory, Lemont, IL60439, USA, United States
Zichao Wendy Di
Affiliation:
Mathematics and Computer Science Division, Argonne National Laboratory, United States
Tao Ma
Affiliation:
Michigan Center for Materials Characterization, United States
Huihuo Zheng
Affiliation:
Argonne Leadership Computing Facility, Argonne National Laboratory, United States
Steve Rozeveld
Affiliation:
Dow Chemical Co., United States
Robert Hovden
Affiliation:
Department of Materials Science and Engineering, University of Michigan, United States

Abstract

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Type
Nanoscale x-ray and Electron Microscopy Techniques and Applications in Material Science
Information
Microscopy and Microanalysis , Volume 27 , Supplement S1 , August 2021 , pp. 1226 - 1228
Copyright
Copyright © The Author(s), 2021. Published by Cambridge University Press on behalf of the Microscopy Society of America

References

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Jiang, Y., et al. Nature 559, 343 (2018).CrossRefGoogle Scholar
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