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Reconstruction Strategies for Combined Tilt- and Focal Series Scanning Transmission Electron Microscopy

Published online by Cambridge University Press:  23 September 2015

Tim Dahmen
Affiliation:
German Research Center for Artificial Intelligence GmbH (DFKI), 66123 Saarbrucken, Germany
Holger Kohr
Affiliation:
KTH Royal Institute of Technology, Dep. of Mathematics, Lindstedtsvagen 25, Stockholm, SE 100 44
Niels de Jonge
Affiliation:
INM - Leibniz Institute for New Materials, 66123 Saarbrucken, Germany Email of the presenting author: Tim.Dahmen@dfki.de
Philipp Slusallek
Affiliation:
German Research Center for Artificial Intelligence GmbH (DFKI), 66123 Saarbrucken, Germany
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Abstract

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Copyright
Copyright © Microscopy Society of America 2015 

References

[1] Dahmen, T & Kohr, H, N deJonge and P Slusallek. Microsc. Microanal. 20 (2014). pp. 548560.CrossRefGoogle Scholar
[2] Hovden, R, et al, Ultramicroscopy 140 (2014). pp. 2631.CrossRefGoogle Scholar
[3] Dahmen, T, et al "Matched Backprojection Operator for Combined Scanning Transmission Electron Tilt- and Focal Series" under review. Microsc. Microanal. (2015).Google Scholar
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