Hostname: page-component-8448b6f56d-qsmjn Total loading time: 0 Render date: 2024-04-25T04:34:06.319Z Has data issue: false hasContentIssue false
  • English
  • Français

Recent Developments in Laboratory X-ray Microanalytical Techniques for Electronic Structure, Chemical Composition, and Microstructure of Metals and Materials

Published online by Cambridge University Press:  30 July 2020

Sylvia Lewis ,
Jeff Gelb ,
S.H. Lau ,
Wenbing Yun ,
David Vine ,
Benjamin Stripe  and
Srivatsan Seshadri
Sylvia Lewis
Affiliation:
Sigray, Inc., Concord, California, United States
Jeff Gelb
Affiliation:
Sigray, Inc., Concord, California, United States
S.H. Lau
Affiliation:
Sigray, Inc., Concord, California, United States
Wenbing Yun
Affiliation:
Sigray, Inc., Concord, California, United States
David Vine
Affiliation:
Sigray, Inc., Concord, California, United States
Benjamin Stripe
Affiliation:
Sigray, Inc., Concord, California, United States
Srivatsan Seshadri
Affiliation:
Sigray, Inc., Concord, California, United States

Abstract

An abstract is not available for this content so a preview has been provided. As you have access to this content, a full PDF is available via the ‘Save PDF’ action button.
Image of the first page of this content. For PDF version, please use the ‘Save PDF’ preceeding this image.'
Type
X-ray, Electron and Synchrotron-Based X-ray Imaging and Analysis
Information
Microscopy and Microanalysis , Volume 26 , Supplement S2 , August 2020 , pp. 516
Check for updates
Copyright
Copyright © Microscopy Society of America 2020

References

Balerna, A, Mobilio, S. Synchrotron Radiations: Basics, Methods and Applications. Germany: Springer; 2015;1:3–27Google Scholar
Bharti, A and Goyal, N. “Fundamental of Synchrotron Radiations,” Synchrotron Radiation - Useful and Interesting Applications. 2018.Google Scholar