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Real-space Measurements of Bonding Charge Density in Aberration-corrected High Resolution Electron Microscopy

Published online by Cambridge University Press:  26 July 2009

J Ciston ,
SJ Haigh ,
JS Kim ,
AI Kirkland  and
LD Marks
J Ciston
Affiliation:
Northwestern University
SJ Haigh
Affiliation:
University of Oxford,United Kingdom
JS Kim
Affiliation:
University of Oxford,United Kingdom
AI Kirkland
Affiliation:
University of Oxford,United Kingdom
LD Marks
Affiliation:
Northwestern University

Extract

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Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

Type
Abstract
Information
Microscopy and Microanalysis , Volume 15 , Supplement S2 , July 2009 , pp. 1478 - 1479
Copyright
Copyright © Microscopy Society of America 2009