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Quantitative STEM of Catalyst Nanoparticles using ADF Imaging with Simultaneous EDS and EELS Spectroscopy.

Published online by Cambridge University Press:  04 August 2017

Aakash M Varambhia ,
Lewys Jones ,
Annick De Backer ,
Sandra Van Aert ,
Dogan Ozkaya ,
Sergio Lozano-Perez  and
Peter D Nellist
Aakash M Varambhia
Affiliation:
Department of Materials, Oxford University, Parks Road, Oxford OX1 3PH, UK
Lewys Jones
Affiliation:
Department of Materials, Oxford University, Parks Road, Oxford OX1 3PH, UK
Annick De Backer
Affiliation:
EMAT, University of Antwerp, Groenenborgerlaan 171, B-2020 Antwerp, Belgium
Sandra Van Aert
Affiliation:
EMAT, University of Antwerp, Groenenborgerlaan 171, B-2020 Antwerp, Belgium
Dogan Ozkaya
Affiliation:
Johnson Matthey Technology Centre, Blounts Court Road, Sonning Common, Reading RG4 9NH, UK
Sergio Lozano-Perez
Affiliation:
Department of Materials, Oxford University, Parks Road, Oxford OX1 3PH, UK
Peter D Nellist
Affiliation:
Department of Materials, Oxford University, Parks Road, Oxford OX1 3PH, UK

Abstract

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Type
Abstract
Information
Microscopy and Microanalysis , Volume 23 , Supplement S1: Proceedings of Microscopy & Microanalysis 2017 , July 2017 , pp. 1888 - 1889
Copyright
© Microscopy Society of America 2017 

References

[1] Jones, L., et al, Nanolett 2014 14, 6336.CrossRefGoogle Scholar
[2] Varambhia, A.M., et al, Particle & Particle Systems Characterization 2016 33, 438–444.Google Scholar
[3] , H. E, et al, Ultramicroscopy 2013 133, 109.Google Scholar
[4] MacArthur, K. E., et al, Microsc. Microanal 2016 22, 71.CrossRefGoogle Scholar
[5] Craven, A. J., et al, Ultramicroscopy 2016 170, 113.Google Scholar
[6] Jones, L., et al, Advanced Structural and Chemical Imaging 2015 1, 8.Google Scholar