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Quantitative Measurements of the Penumbra of XEDS Systems in an AEM

Published online by Cambridge University Press:  25 July 2016

Nestor J. Zaluzec ,
Jianguo Wen ,
Jie Wang  and
Dean J. Miller
Nestor J. Zaluzec
Affiliation:
Electron Microscopy Center, Center for Nanoscale Materials, Argonne National Laboratory, Argonne, IL, USA
Jianguo Wen
Affiliation:
Electron Microscopy Center, Center for Nanoscale Materials, Argonne National Laboratory, Argonne, IL, USA
Jie Wang
Affiliation:
Electron Microscopy Center, Center for Nanoscale Materials, Argonne National Laboratory, Argonne, IL, USA
Dean J. Miller
Affiliation:
Electron Microscopy Center, Center for Nanoscale Materials, Argonne National Laboratory, Argonne, IL, USA

Abstract

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Type
Abstract
Information
Microscopy and Microanalysis , Volume 22 , Supplement S3: Proceedings of Microscopy & Microanalysis 2016 , July 2016 , pp. 278 - 279
Copyright
© Microscopy Society of America 2016 

References

References:

[1] Zaluzec, N.J. “XEDS Tools: Solid Angle Calculator”, Website: <underline>http://tpm.amc.anl.gov/NJZTools/XEDSSolidAngle.html</underline>.http://tpm.amc.anl.gov/NJZTools/XEDSSolidAngle.html.>Google Scholar
[2] Zaluzec, N.J., Roussie, J. & DesOrmeaux, J.P. (2016). 22, these proceedings.Google Scholar
[3] Zaluzec Microsc., N.J. Microanaly (2014) 20(4), 1318–1326.Google Scholar
[4] Research supported by U.S. DoE, Office of Science, Contract No. DE-AC02-06CH11357 at the Electron Microscopy Center, Center for Nanoscale Materials at Argonne National Laboratory.Google Scholar