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Quantitative Electron-Excited X-ray Microanalysis at Low Beam Energy

Published online by Cambridge University Press:  23 September 2015

Dale E. Newbury
Affiliation:
National Institute of Standards and Technology, Gaithersburg, MD 20899-8370
Nicholas W. M. Ritchie
Affiliation:
National Institute of Standards and Technology, Gaithersburg, MD 20899-8370

Abstract

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Type
Abstract
Copyright
Copyright © Microscopy Society of America 2015 

References

[1] Newbury, D. & Ritchie, N., Microsc. Microanal. 20(Suppl 3 (2014) 702.CrossRefGoogle Scholar