Off-axis electron holography is a powerful method for providing quantitative micromagnetic structure to nanometer-scale resolution. One of the main challenges in determining magnetic induction from reconstructed phase images is the separation of phase shifts due to electrostatic and thickness effects from magnetostatic effects. We have used in-situ magnetization reversal to remove electrostatic and thickness effects which would otherwise prevent quantification of the induction. The Philips CM200-FEG microscope which was used for the holography described here is equipped with a powerful mini-lens below the specimen enabling 2nm spatial resolution (∼5nm phase resolution) and only a small residual field at the sample. In addition, the objective lens field versus current has been calibrated so that external vertical fields over a wide range of values may be applied to the sample. Tilting the sample in the presence of the vertical field has the effect of ‘applying an inplane component. This combination of high spatial resolution, quantitative analysis and in situ capabilities allows for the study of individual defects and provides experimental input for comparison with simulations.