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Quantitative defect analysis using electron channeling contrast imaging under controlled diffraction conditions (cECCI)

Published online by Cambridge University Press:  23 November 2012

N. Elhami ,
C. Tasan  and
S. Zaefferer
N. Elhami
Affiliation:
Max-Planck-Institute for Iron, Duesseldorf, Germany
C. Tasan
Affiliation:
Max-Planck-Institute for Iron, Duesseldorf, Germany
S. Zaefferer
Affiliation:
Max-Planck-Institute for Iron, Duesseldorf, Germany
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Abstract

Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.

Type
Research Article
Information
Microscopy and Microanalysis , Volume 18 , Issue S2: Proceedings of Microscopy & Microanalysis 2012 , July 2012 , pp. 690 - 691
Copyright
Copyright © Microscopy Society of America 2012

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