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Quantitative Characterization of Crystal Defects in Planetary Materials in a Scanning Electron Microscope (SEM)

Published online by Cambridge University Press:  01 August 2018

Shirin Kaboli  and
Pamela C. Burnley
Shirin Kaboli
Affiliation:
Geoscience Department and High Pressure Science and Engineering Center, University of Nevada Las Vegas, Las Vegas, United States.
Pamela C. Burnley
Affiliation:
Geoscience Department and High Pressure Science and Engineering Center, University of Nevada Las Vegas, Las Vegas, United States.

Abstract

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Abstract
Information
Microscopy and Microanalysis , Volume 24 , Supplement S1: Proceedings of Microscopy & Microanalysis 2018 , August 2018 , pp. 2094 - 2095
Copyright
© Microscopy Society of America 2018 

References

[1] Weidner, D.J., Wang, Y., Chen, G., Ando, J. Vaughan, M.T. in Properties of Earth and Planetary Materials at High Pressure and Temperature (ed M.H. Manghnani and T. Yagi American Geophysical Union Washington, D. C p 473.Google Scholar
[2] Wilkinson, A.J. Hirsch, P.B. Micron 28 1997) p 279.Google Scholar
[3] This research was sponsored by the National Science Foundation under award NSF-EAR13613399 Additional support was provided to the second author by the National Nuclear Security Administration under the Stewardship Science Academic Alliances program through DOE Cooperative Agreement #DE-NA0001982. Synchrotron experiments were performed at the Advanced Photon Source which is supported by DOE-BES, under Contract No. DE-AC02-06CH11357 at Sector 6BM which is supported by the Consortium for Materials Properties Research in Earth Sciences under NSF cooperative agreement EAR 06-49658.Google Scholar