Hostname: page-component-8448b6f56d-cfpbc Total loading time: 0 Render date: 2024-04-19T15:13:12.461Z Has data issue: false hasContentIssue false
  • English
  • Français

Quantitative Characterisation of Surface Defects and Composition on PtRu Nanoparticles Using Aberration-Corrected TEM/STEM

Published online by Cambridge University Press:  26 July 2009

L-Y Chang ,
S Lazar ,
EA Baranova ,
C Bock  and
GA Botton
L-Y Chang
Affiliation:
McMaster University,Canada
S Lazar
Affiliation:
FEI Company,Netherlands
EA Baranova
Affiliation:
National Research Council,Canada
C Bock
Affiliation:
National Research Council,Canada
GA Botton
Affiliation:
McMaster University,Canada

Extract

Core share and HTML view are not available for this content. However, as you have access to this content, a full PDF is available via the ‘Save PDF’ action button.

Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

Type
Abstract
Information
Microscopy and Microanalysis , Volume 15 , Supplement S2 , July 2009 , pp. 1416 - 1417
Copyright
Copyright © Microscopy Society of America 2009