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Quantification of Subsurface Damage in a Brittle Insulating Ceramic by Three-Dimensional Focused Ion Beam Tomography

Published online by Cambridge University Press:  04 March 2011

N. Payraudeau ,
D. McGrouther  and
K.U. O'Kelly
N. Payraudeau*
Affiliation:
Department of Mechanical and Manufacturing Engineering, Trinity College Dublin, Dublin 2, Ireland
D. McGrouther
Affiliation:
S.U.P.A, School of Physics and Astronomy, University of Glasgow, Glasgow G12 8QQ, United Kingdom
K.U. O'Kelly
Affiliation:
Department of Mechanical and Manufacturing Engineering, Trinity College Dublin, Dublin 2, Ireland
*
Corresponding author. E-mail: payraudn@tcd.ie
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Abstract

In this study, we present a fully automated method to investigate and reconstruct the three-dimensional crack structure beneath an indent in a highly insulating material. This work concentrates on issues arising from a long automatic acquisition process, the insulating nature of the specimen, and the introduction of minimal damage to the original cracks resulting from indentation.

Keywords

focused ion beam (FIB) microscopycrackmicrostructureceramictomography
Type
Material Applications
Information
Microscopy and Microanalysis , Volume 17 , Issue 2 , April 2011 , pp. 240 - 245
Copyright
Copyright © Microscopy Society of America 2011

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References

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