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Q.U.A.I.N.T.P.E.A.X. QUantifying Algorithmically INTrinsic Properties of Electronic Assemblies via X-ray CT

Published online by Cambridge University Press:  30 July 2021

John True ,
Nathan Jessurun ,
Dhwani Mehta  and
Navid Asadi
John True
Affiliation:
University of Florida; Florida Institute for Cyber Security Research (F.I.C.S.), United States
Nathan Jessurun
Affiliation:
Florida Institute for Cyber Security Research, Gainesville, Florida, United States
Dhwani Mehta
Affiliation:
Florida Institute for Cyber Security Research, Gainesville, Florida, United States
Navid Asadi
Affiliation:
University of Florida; Florida Institute for Cyber Security Research (F.I.C.S.), United States

Abstract

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Type
Nanoscale x-ray and Electron Microscopy Techniques and Applications in Material Science
Information
Microscopy and Microanalysis , Volume 27 , Supplement S1 , August 2021 , pp. 1222 - 1225
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Copyright
Copyright © The Author(s), 2021. Published by Cambridge University Press on behalf of the Microscopy Society of America

References

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