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Pushing the XEDS Boundaries in Materials Research: Low Voltage XED Spectrum Imaging in the FEG-SEM

Published online by Cambridge University Press:  25 July 2016

Arne Janssen ,
M. G. Burke  and
Simon Burgess
Arne Janssen
Affiliation:
Materials Performance Centre, School of Materials, The University of Manchester, Manchester, UK.
M. G. Burke
Affiliation:
Materials Performance Centre, School of Materials, The University of Manchester, Manchester, UK.
Simon Burgess
Affiliation:
Oxford Instruments NanoAnalysis, UK

Abstract

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Abstract
Information
Microscopy and Microanalysis , Volume 22 , Supplement S3: Proceedings of Microscopy & Microanalysis 2016 , July 2016 , pp. 442 - 443
Copyright
© Microscopy Society of America 2016 

References

[1] We thank James Holland for valuable technical discussions and suggestions.Google Scholar