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Prospects for Bright Field and Dark Field Electron Tomography on a Discrete Grid

Published online by Cambridge University Press:  01 August 2004

J. R. Jinschek ,
K. J. Batenburg ,
H. A. Calderon ,
D. Van Dyck ,
F.-R. Chen ,
V. Radmilovic  and
C. Kisielowski
J. R. Jinschek
Affiliation:
National Center for Electron Microscopy, Berkeley, California
K. J. Batenburg
Affiliation:
Leiden University, Amsterdam, The Netherlands
H. A. Calderon
Affiliation:
ESFM-IPN, Mexico
D. Van Dyck
Affiliation:
University of Antwerp, Belgium
F.-R. Chen
Affiliation:
National Tsing Hua University, HsinChu, Taiwan
V. Radmilovic
Affiliation:
National Center for Electron Microscopy, Berkeley, California
C. Kisielowski
Affiliation:
National Center for Electron Microscopy, Berkeley, California
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Extract

Extended abstract of a paper presented at the Pre-Meeting Congress: Materials Research in an Aberration-Free Environment, at Microscopy and Microanalysis 2004 in Savannah, Georgia, USA, July 31 and August 1, 2004.

Type
Research Article
Information
Microscopy and Microanalysis , Volume 10 , Issue S03 , August 2004 , pp. 44 - 45
Copyright
© 2004 Microscopy Society of America

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