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Probing Two-dimensional (Bi,Sb)2Te3/h-BN Heterostructures Using Complementary S/TEM and Simulation Techniques

Published online by Cambridge University Press:  04 August 2017

Danielle Reifsnyder Hickey
Affiliation:
Department of Chemical Engineering and Materials Science, University of Minnesota, Minneapolis, MN 55455, United States
Joon Sue Lee
Affiliation:
Department of Physics, The Pennsylvania State University, University Park, PA 16802, United States
Ryan J. Wu
Affiliation:
Department of Chemical Engineering and Materials Science, University of Minnesota, Minneapolis, MN 55455, United States
Nitin Samarth
Affiliation:
Department of Physics, The Pennsylvania State University, University Park, PA 16802, United States
K. Andre Mkhoyan
Affiliation:
Department of Chemical Engineering and Materials Science, University of Minnesota, Minneapolis, MN 55455, United States

Abstract

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Type
Abstract
Copyright
© Microscopy Society of America 2017 

References

[1] Mellnik, AR, et al, Nature 511 2014). p. 449.Google Scholar
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[3] Lee, JS, et al, Phys. Rev. B 92 2015 155312.Google Scholar
[4] Jamali, M, et al, Nano Lett. 15 2015). p. 7126.Google Scholar
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[6] The authors gratefully acknowledge funding provided by C-SPIN, one of six centers of STARnet, a Semiconductor Research Corporation program, sponsored by MARCO and DARPA.Google Scholar