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Probing Strain-Induced Phenomena in Low Dimensionality Multiferroic Oxides

Published online by Cambridge University Press:  04 August 2017

C. Magen ,
R. Guzman ,
S. Farokhipoor ,
L. Maurel ,
E. Langenberg ,
J. Iniguez ,
S. Venkatesan ,
Andrew R. Lupini ,
E. Snoeck  and
M. Mostovoy
...Show all authors
C. Magen
Affiliation:
Laboratorio de Microscopias Avanzadas (LMA), Instituto de Nanociencia de Aragon (INA), Univ. de Zaragoza, Zaragoza, Spain.
R. Guzman
Affiliation:
Laboratorio de Microscopias Avanzadas (LMA), Instituto de Nanociencia de Aragon (INA), Univ. de Zaragoza, Zaragoza, Spain. Institut de Ciencia de Materials de Barcelona, ICMAB-CSIC, Barcelona, Spain.
S. Farokhipoor
Affiliation:
Zernike Institute for Advanced Materials, Univ. of Groningen, AG Groningen, Netherlands. Department of Materials Science & Metallurgy, Univ. of Cambridge, UK.
L. Maurel
Affiliation:
Instituto de Nanociencia de Aragon (INA), Univ. de Zaragoza, Zaragoza, Spain.
E. Langenberg
Affiliation:
Instituto de Nanociencia de Aragon (INA), Univ. de Zaragoza, Zaragoza, Spain. Instituto de Ciencia de Materiales de Aragon, Univ. de Zaragoza-CSIC, Zaragoza, Spain.
J. Iniguez
Affiliation:
Institut de Ciencia de Materials de Barcelona, ICMAB-CSIC, Barcelona, Spain. Luxembourg Institute of Science and Technology (LIST), Esch/Alzette, Luxembourg.
S. Venkatesan
Affiliation:
Ludwig-Maximilians-Universitat Munchen, Munich, Germany.
Andrew R. Lupini
Affiliation:
Materials Science and Technology Division, Oak Ridge National Laboratory, Tennessee, US.
E. Snoeck
Affiliation:
CEMES - CNRS, Toulouse, France.
M. Mostovoy
Affiliation:
Zernike Institute for Advanced Materials, Univ. of Groningen, AG Groningen, Netherlands.
P. A. Algarabel
Affiliation:
Instituto de Ciencia de Materiales de Aragon, Univ. de Zaragoza-CSIC, Zaragoza, Spain.
J. A. Pardo
Affiliation:
Laboratorio de Microscopias Avanzadas (LMA), Instituto de Nanociencia de Aragon (INA), Univ. de Zaragoza, Zaragoza, Spain.
B. Noheda
Affiliation:
Zernike Institute for Advanced Materials, Univ. of Groningen, AG Groningen, Netherlands.

Abstract

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Abstract
Information
Microscopy and Microanalysis , Volume 23 , Supplement S1: Proceedings of Microscopy & Microanalysis 2017 , July 2017 , pp. 1726 - 1727
Copyright
© Microscopy Society of America 2017 

References

[1] “Scanning Transmission Electron Microscopy”, ed. S J Pennycook and P D Nellist (Springer New York, 2011).Google Scholar
[2] Varela, M, Gazquez, J & Pennycook, S J MRS Bulletin 37 2012). p. 29.CrossRefGoogle Scholar
[3] Farokhipoor, S, Magen, C, Venkatesan, S, Iniguez, J, Daumont, C J M, et al, Nature 515 2014). p. 373.CrossRefGoogle Scholar
[4] Guzman, R, Maurel, L, Langenberg, E, Lupini, A R., et al, Nano Letters 16 2016). p. 2221.CrossRefGoogle Scholar
[5] Research at ORNL supported by Division of Materials Sciences and Engineering Division, Office of Basic Energy Sciences, U.S. DOE.Google Scholar