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Preliminary Study on High-sensitive Diffraction Enhanced Imaging at BSRF

Published online by Cambridge University Press:  10 August 2018

Qingxi Yuan ,
Jin Zhang ,
Yu Chen ,
Kai Zhang ,
Wanxia Huang  and
Peiping Zhu
Qingxi Yuan*
Affiliation:
Institute of High Energy Physics, Chinese Academy of Sciences, Beijing, P. R. China.
Jin Zhang
Affiliation:
Institute of High Energy Physics, Chinese Academy of Sciences, Beijing, P. R. China. University of Chinese Academy of Sciences, Beijing, P. R. China.
Yu Chen
Affiliation:
Institute of High Energy Physics, Chinese Academy of Sciences, Beijing, P. R. China.
Kai Zhang
Affiliation:
Institute of High Energy Physics, Chinese Academy of Sciences, Beijing, P. R. China.
Wanxia Huang
Affiliation:
Institute of High Energy Physics, Chinese Academy of Sciences, Beijing, P. R. China.
Peiping Zhu
Affiliation:
Institute of High Energy Physics, Chinese Academy of Sciences, Beijing, P. R. China.
*
* Corresponding author, email_yuanqx@ihep.ac.cn

Abstract

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Abstract
Information
Microscopy and Microanalysis , Volume 24 , Supplement S2: Proceedings of the 14th International Conference on X-ray Microscopy (XRM2018) , August 2018 , pp. 100 - 101
Copyright
© Microscopy Society of America 2018 

References

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