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Precise Measurement of Carrier Concentrations in n-Type GaN by Phase-Shifting Electron Holography
Published online by Cambridge University Press: 05 August 2019
Abstract
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- Type
- Advances in Phase Retrieval Microscopy
- Information
- Copyright
- Copyright © Microscopy Society of America 2019
References
[1]Ru, Q., Lai, G., Aoyama, K., Endo, J., and Tonomura, A., Ultramicroscopy 55 (1994) 209-220.Google Scholar
[2]Yamamoto, K., Kawajiri, I., Tanji, T., Hibino, M., and Hirayama, T., J. Electron Microsc. 49 (2000) 31-39.Google Scholar
[3]Anada, S., Yamamoto, K., Sasaki, H., Shibata, N., Matsumoto, M., Hori, Y., Kinugawa, K., Imamura, A., and Hirayama, T. Microscopy (2018) (in press): doi: 10.1093/jmicro/dfy131.Google Scholar
[4]The authors acknowledge funding from JST, Super Cluster program, and from JSPS, Grant-in-Aid for Scientific Research KAKENHI [grant numbers JP 18K13795, JP 17H02792].Google Scholar