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Practical Considerations for Electron Holography on Doped Semiconductor Devices

Published online by Cambridge University Press:  01 August 2002

Alexander Thesen ,
Bernhard G. Frost  and
David C. Joy
Alexander Thesen
Affiliation:
EM Facility, University of Tennessee, Knoxville, TN 37996 and High Temperatures Materials Laboratory, Oak Ridge National Laboratory, Bethel Valley Road 1, Oak Ridge, TN 37831
Bernhard G. Frost
Affiliation:
EM Facility, University of Tennessee, Knoxville, TN 37996 and High Temperatures Materials Laboratory, Oak Ridge National Laboratory, Bethel Valley Road 1, Oak Ridge, TN 37831
David C. Joy
Affiliation:
EM Facility, University of Tennessee, Knoxville, TN 37996 and High Temperatures Materials Laboratory, Oak Ridge National Laboratory, Bethel Valley Road 1, Oak Ridge, TN 37831

Abstract

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Type
Abstract
Information
Microscopy and Microanalysis , Volume 8 , Issue S02 , August 2002 , pp. 516 - 517
Copyright
Copyright © Microscopy Society of America 2002