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The Possibility of TEM-based X-ray Microanalysis with a Microcalorimeter Detector

Published online by Cambridge University Press:  01 August 2004

E. A. Kenik ,
I. M. Anderson ,
D. C. Joy  and
H. Demers
E. A. Kenik
Affiliation:
Oak Ridge National Laboratory, Oak Ridge, Tennessee
I. M. Anderson
Affiliation:
Oak Ridge National Laboratory, Oak Ridge, Tennessee
D. C. Joy
Affiliation:
Oak Ridge National Laboratory, Oak Ridge, Tennessee University of Tennessee, Knoxville
H. Demers
Affiliation:
Oak Ridge National Laboratory, Oak Ridge, Tennessee McGill University, Montréal, Québec, Canada
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Extract

Extended abstract of a paper presented at the Pre-Meeting Congress: Materials Research in an Aberration-Free Environment, at Microscopy and Microanalysis 2004 in Savannah, Georgia, USA, July 31 and August 1, 2004.

Type
Research Article
Information
Microscopy and Microanalysis , Volume 10 , Issue S03 , August 2004 , pp. 58 - 59
Copyright
© 2004 Microscopy Society of America

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