Hostname: page-component-77c89778f8-swr86 Total loading time: 0 Render date: 2024-07-19T01:27:15.473Z Has data issue: false hasContentIssue false
  • English
  • Français

Portable XRF and Raman Analysis of a ‘Modigliani’ Signature Painting

Published online by Cambridge University Press:  23 November 2012

G. Casuccio ,
K. Bunker ,
S. Kennedy ,
M. Sparrow ,
B. Pacolay ,
P. Ioannidis  and
R. Foulke
G. Casuccio
Affiliation:
RJ Lee Group, Inc., Monroeville, PA
K. Bunker
Affiliation:
RJ Lee Group, Inc., Monroeville, PA
S. Kennedy
Affiliation:
RJ Lee Group, Inc., Monroeville, PA
M. Sparrow
Affiliation:
RJ Lee Group, Inc., Monroeville, PA
B. Pacolay
Affiliation:
RJ Lee Group, Inc., Monroeville, PA
P. Ioannidis
Affiliation:
RJ Lee Group, Inc., Monroeville, PA
R. Foulke
Affiliation:
Foulke Fine Art Conservation, LLC, Pittsburgh, PA
Get access

Abstract

Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.

Type
Research Article
Information
Microscopy and Microanalysis , Volume 18 , Issue S2: Proceedings of Microscopy & Microanalysis 2012 , July 2012 , pp. 958 - 959
Copyright
Copyright © Microscopy Society of America 2012

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)